Invention Grant
- Patent Title: Test strip container with integrated meter
- Patent Title (中): 带集成仪表的试纸容器
-
Application No.: US11254881Application Date: 2005-10-21
-
Publication No.: US08394337B2Publication Date: 2013-03-12
- Inventor: Gary T. Neel , Brent E. Modzelewski , Cameron Scott Casterline , George R. Rounds
- Applicant: Gary T. Neel , Brent E. Modzelewski , Cameron Scott Casterline , George R. Rounds
- Applicant Address: US FL Fort Lauderdale
- Assignee: Nipro Diagnostics, Inc.
- Current Assignee: Nipro Diagnostics, Inc.
- Current Assignee Address: US FL Fort Lauderdale
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- Main IPC: B01L3/00
- IPC: B01L3/00 ; G01N31/22 ; G01N33/52 ; G01N21/75 ; G01N35/00 ; G01N15/06 ; G01N33/00 ; G01N33/48 ; G01N21/00 ; G01N25/08

Abstract:
A system for diagnostic testing may include a meter for performing a diagnostic test on a sample applied to a test media and a container configured to contain test media compatible with the meter. The meter may include a closure portion for selectively closing the opening of the container. The system may further provide a sampling device, such as a lancet, operable connected to the container such that that a user may use the sampling device to obtain a sample without disconnecting the sampling device from the container. The system may also provide mechanisms for removing a meter from a test container and reattaching it to a new one using one of several coding methods that recalibrate the meter for the new container of test strips. In addition, the system may further provide mechanisms to reconfigure the meter to perform a new function when it has been determined that the triggering event has occurred.
Public/Granted literature
- US20060094986A1 Test strip container with integrated meter Public/Granted day:2006-05-04
Information query
IPC分类: