Dielectric spacers for metal interconnects and method to form the same

Invention Grant

US08394701B2 Dielectric spacers for metal interconnects and method to form the same 有权

Title translation: 用于金属互连的电介质隔离件及其形成方法

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Patent Title: Dielectric spacers for metal interconnects and method to form the same
Patent Title (中): 用于金属互连的电介质隔离件及其形成方法
Application No.: US13069253

Application Date: 2011-03-22
Publication No.: US08394701B2

Publication Date: 2013-03-12
Inventor: Makarem A. Hussein , Boyan Boyanov
Applicant: Makarem A. Hussein , Boyan Boyanov
Applicant Address: US CA Santa Clara
Assignee: Intel Corporation
Current Assignee: Intel Corporation
Current Assignee Address: US CA Santa Clara
Agency: Blakely, Sokoloff, Taylor & Zafman LLP
Main IPC: H01L21/8236
IPC: H01L21/8236 ; H01L21/4763

Dielectric spacers for metal interconnects and method to form the same

Abstract:

A plurality of metal interconnects incorporating dielectric spacers and a method to form such dielectric spacers are described. In one embodiment, the dielectric spacers adjacent to neighboring metal interconnects are discontiguous from one another. In another embodiment, the dielectric spacers may provide a region upon which un-landed vias may effectively land.

Abstract(Chinese):

描述了包含电介质间隔物的多个金属互连件和形成这种介电间隔物的方法。在一个实施例中，与相邻金属互连件相邻的电介质间隔物彼此不连续。在另一个实施例中，电介质间隔件可提供未着陆过孔可有效降落的区域。

Public/Granted literature

US20110171823A1 DIELECTRIC SPACERS FOR METAL INTERCONNECTS AND METHOD TO FORM THE SAME Public/Granted day:2011-07-14

Information query

Espacenet

IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L21/00	专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/70	.由在一共用基片内或其上形成的多个固态组件或集成电路组成的器件或其部件的制造或处理；集成电路器件或其特殊部件的制造（由预制电组件组成的组装件的制造入H05K3/00，H05K13/00）
H01L21/77	..在公共衬底中或上面形成的由许多固态元件或集成电路组成的器件的制造或处理（电可编程只读存储器或其多步骤的制造方法入H01L27/115）
H01L21/78	...把衬底连续地分成多个独立的器件（改变表面物理特性或者半导体形状的切割入H01L21/304）
H01L21/82	....制造器件，例如每一个由许多元件组成的集成电路
H01L21/822	.....衬底是采用硅工艺的半导体的（H01L21/8258优先）
H01L21/8232	......场效应工艺
H01L21/8234	.......MIS工艺
H01L21/8236	........增强型和耗尽型晶体管的组合