Invention Grant
- Patent Title: Holder for an electron microscopy sample carrier
- Patent Title (中): 用于电子显微镜样品载体的支架
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Application No.: US13304711Application Date: 2011-11-28
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Publication No.: US08395130B2Publication Date: 2013-03-12
- Inventor: Leander Gächter
- Applicant: Leander Gächter
- Applicant Address: CH Heerbrugg
- Assignee: Leica Microsystems (Schweiz) AG
- Current Assignee: Leica Microsystems (Schweiz) AG
- Current Assignee Address: CH Heerbrugg
- Agency: Hodgson Russ LLP
- Priority: AT1986/10 20101129
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/26 ; G01N23/225

Abstract:
A mount (100, 200) for holding an electron microscopy sample carrier (310) comprises a base plate (101) having an opening (103) through a middle region thereof and a support surface (107) for the sample carrier (310) extending at least partly around the opening (103), a holding apparatus (104a, 104b) for frictionally engaged holding of the sample carrier (310) on the support surface (107) being provided on the base plate (101), the holding apparatus (104a, 104b) comprising at least two mutually independent clip elements (104a, 104b) that extend from the base plate (101) toward the opening (103) and by means of which edge regions (313a, 313b), spaced apart from one another, of the electron microscopy sample carrier (310) are holdable on the support surface (107). The invention further encompasses a loading apparatus for loading a mount with an electron microscopy sample carrier, and a method for using the loading apparatus.
Public/Granted literature
- US20120132828A1 HOLDER FOR AN ELECTRON MICROSCOPY SAMPLE CARRIER Public/Granted day:2012-05-31
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