Invention Grant
US08395136B2 Positional deviation detection apparatus and process system employing the same
有权
位置偏差检测装置及采用该位置检测装置的处理系统
- Patent Title: Positional deviation detection apparatus and process system employing the same
- Patent Title (中): 位置偏差检测装置及采用该位置检测装置的处理系统
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Application No.: US12602174Application Date: 2008-05-22
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Publication No.: US08395136B2Publication Date: 2013-03-12
- Inventor: Keisuke Kondoh
- Applicant: Keisuke Kondoh
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2007-155506 20070612
- International Application: PCT/JP2008/059463 WO 20080522
- International Announcement: WO2008/152895 WO 20081218
- Main IPC: G01N21/86
- IPC: G01N21/86 ; G06M7/00

Abstract:
In a positional deviation detection apparatus provided with a transfer mechanism where plural arm portions are connected pivotably and in series with each other, the transfer mechanism being adapted to hold and transfer an object to be processed with a distal end arm portion, there are provided an edge detection unit that detects at least an edge of the object to be detected held by the distal end arm portion, the edge detection unit being provided in an arm portion among the plural arm portions, except for the distal end arm portion; and a positional deviation detection portion that obtains positional deviation of the object to be processed, in accordance with a detected value of the edge detection unit.
Public/Granted literature
- US20100172720A1 POSITIONAL DEVIATION DETECTION APPARATUS AND PROCESS SYSTEM EMPLOYING THE SAME Public/Granted day:2010-07-08
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