Invention Grant
- Patent Title: Cross-point memory utilizing Ru/Si diode
- Patent Title (中): 使用Ru / Si二极管的交叉点存储器
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Application No.: US12833314Application Date: 2010-07-09
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Publication No.: US08395140B2Publication Date: 2013-03-12
- Inventor: Nirmal Ramaswamy , Kirk D. Prall
- Applicant: Nirmal Ramaswamy , Kirk D. Prall
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: H01L45/00
- IPC: H01L45/00

Abstract:
Memory devices utilizing memory cells including a resistive element and a diode coupled in series between two conductors. The diodes include a ruthenium material and a silicon material. The diodes further include an interface on the silicon material of ruthenium or ruthenium silicide. A ruthenium silicide interface may be a polycrystalline ruthenium silicide.
Public/Granted literature
- US20120007037A1 CROSS-POINT MEMORY UTILIZING Ru/Si DIODE Public/Granted day:2012-01-12
Information query
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