Invention Grant
- Patent Title: Optical devices and methods for measuring samples
- Patent Title (中): 用于测量样品的光学装置和方法
-
Application No.: US12820104Application Date: 2010-06-21
-
Publication No.: US08395773B2Publication Date: 2013-03-12
- Inventor: Imran R. Malik , Axel Scherer
- Applicant: Imran R. Malik , Axel Scherer
- Applicant Address: US CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: US CA Pasadena
- Agency: Steinfl & Bruno, LLP
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/55

Abstract:
Optical devices and methods for measuring samples while minimizing stray light are described. Such methods and devices are applicable to multiple fluid chambers with multiple sources as an integrated optical element. Light sources can be embedded onto a chip or microarray with multiple chambers, or can be part of an instrument arrangement.
Public/Granted literature
- US20100321696A1 OPTICAL DEVICES AND METHODS FOR MEASURING SAMPLES Public/Granted day:2010-12-23
Information query