Invention Grant
- Patent Title: Methods and apparatus for voltage sensing and reporting
- Patent Title (中): 电压检测和报告的方法和装置
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Application No.: US13424936Application Date: 2012-03-20
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Publication No.: US08395958B2Publication Date: 2013-03-12
- Inventor: David R. Resnick
- Applicant: David R. Resnick
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: G11C7/00
- IPC: G11C7/00
Abstract:
Semiconductor devices comprising at least one voltage sensor for sensing an operating voltage associated with an operational circuit of the semiconductor device. The at least one voltage sensor is configured to generate a signal indicative of a state of the operating voltage. Methods of monitoring a voltage in a semiconductor device include determining a magnitude of an operating voltage for an operational circuit in a semiconductor device. A signal may be generated indicating a state of the operating voltage.
Public/Granted literature
- US20120176847A1 METHODS AND APPARATUS FOR VOLTAGE SENSING AND REPORTING Public/Granted day:2012-07-12
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