Invention Grant
- Patent Title: X-ray inspection tool
- Patent Title (中): X光检查工具
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Application No.: US12965159Application Date: 2010-12-10
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Publication No.: US08396187B2Publication Date: 2013-03-12
- Inventor: Morteza Safai
- Applicant: Morteza Safai
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Agency: Yee & Associates, P.C.
- Main IPC: G01B15/06
- IPC: G01B15/06

Abstract:
The different advantageous embodiments provide an apparatus and a method for inspecting a surface of a work piece. In one advantageous embodiment, an apparatus comprising a number of tracks, a support structure, connection system, and controller is disclosed. The number of tracks are configured for placement along a path. The support structure is configured to move on the number of tracks. The X-ray system is moveably connected to the support structure. The X-ray system is configured to send a plurality of X-rays toward a work piece and is configured to move along an axis through the support structure. The connection system is configured to removably connect the number of tracks to the work piece using a vacuum applied to a surface of the work piece. The controller is configured to activate and deactivate the X-ray system based on an amount of vacuum applied to the surface of the work piece.
Public/Granted literature
- US20120148026A1 X-Ray Inspection Tool Public/Granted day:2012-06-14
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