Invention Grant
- Patent Title: Communication test device and communication test method
- Patent Title (中): 通信测试设备和通信测试方法
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Application No.: US13589573Application Date: 2012-08-20
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Publication No.: US08396429B2Publication Date: 2013-03-12
- Inventor: Yuichi Negami , Akihide Egawa , Hiroyuki Tsuda , Tsuyoshi Sato , Takuma Goto
- Applicant: Yuichi Negami , Akihide Egawa , Hiroyuki Tsuda , Tsuyoshi Sato , Takuma Goto
- Applicant Address: JP Atsugi-shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-shi
- Agency: Greer, Burns & Crain, Ltd.
- Priority: JP2007-028724 20070208
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
A communication test device can assist in identifying a cause of a change in throughput of a mobile communication terminal. The communication test device accumulates (a) trace data on a specific unit of data complying with a designated communication standard, and (b) throughput data on throughput of the specific unit of data transmitted to and received from a mobile communication terminal. Trace data and throughput data are extracted from the accumulation, and trace data is displayed. A graph of the variation of throughput with time is displayed on the display unit. Trace data corresponding to a time designated by an operating unit can also be displayed.
Public/Granted literature
- US20130005373A1 COMMUNICATION TEST DEVICE AND COMMUNICATION TEST METHOD Public/Granted day:2013-01-03
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