Invention Grant
- Patent Title: Sorted data outlier identification
- Patent Title (中): 排序的数据异常值识别
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Application No.: US13274520Application Date: 2011-10-17
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Publication No.: US08397202B1Publication Date: 2013-03-12
- Inventor: Bede C. Nnaji
- Applicant: Bede C. Nnaji
- Applicant Address: BM Hamilton
- Assignee: Marvell International Ltd.
- Current Assignee: Marvell International Ltd.
- Current Assignee Address: BM Hamilton
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Systems and methods for performing a signature analysis on sorted data to identify one or more outliers in a dataset. The method includes determining, with a control platform, a percentile range of a sorted dataset, wherein the percentile range includes a first plurality of qualified vector patterns; determining a signature of the percentile range; determining a signature of a second plurality of vector patterns, wherein the second plurality of vector patterns includes a first test vector pattern that is outside of the percentile range; and comparing the signature of the percentile range to the signature of the second plurality of vector patterns. The method further includes, based at least in part on the comparing, identifying the first vector pattern as one of (i) a qualifying vector pattern or (ii) an outlier.
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