Invention Grant
- Patent Title: Ultrasound diagnostic apparatus and ultrasound diagnostic method
- Patent Title (中): 超声诊断仪和超声诊断方法
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Application No.: US12585736Application Date: 2009-09-23
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Publication No.: US08398548B2Publication Date: 2013-03-19
- Inventor: Kimito Katsuyama
- Applicant: Kimito Katsuyama
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Edwards Neils PLLC
- Agent Jean C. Edwards, Esq.
- Priority: JP2008-245520 20080925
- Main IPC: A61B8/00
- IPC: A61B8/00

Abstract:
In an ultrasound diagnosis, the inventor has found a characteristic that coincidence of RF data after matching addition or amplitude image data at the small opening are different between those of an isolated point (minute structure), a continuous surface, and a speckle. On the basis of the characteristic, an ultrasound diagnostic apparatus and method which can distinguish and extract the isolated point, the continuous surface, and the speckle and determine a tissue property are provided.
Public/Granted literature
- US20100076313A1 Ultrasound diagnostic apparatus and ultrasound diagnostic method Public/Granted day:2010-03-25
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