Invention Grant
US08399307B2 Interconnects for stacked non-volatile memory device and method 有权
用于堆叠非易失性存储器件和方法的互连

  • Patent Title: Interconnects for stacked non-volatile memory device and method
  • Patent Title (中): 用于堆叠非易失性存储器件和方法的互连
  • Application No.: US13532019
    Application Date: 2012-06-25
  • Publication No.: US08399307B2
    Publication Date: 2013-03-19
  • Inventor: Scott Brad Herner
  • Applicant: Scott Brad Herner
  • Applicant Address: US CA Santa Clara
  • Assignee: Crossbar, Inc.
  • Current Assignee: Crossbar, Inc.
  • Current Assignee Address: US CA Santa Clara
  • Agency: Ogawa P.C.
  • Main IPC: H01L21/82
  • IPC: H01L21/82
Interconnects for stacked non-volatile memory device and method
Abstract:
A method of forming a memory device includes providing a substrate having a surface region, defining a cell region and first and second peripheral regions, sequentially forming a first dielectric material, a first wiring structure for a first array of devices, and a second dielectric material over the surface region, forming an opening region in the first peripheral region, the opening region extending in a portion of at least the first and second dielectric materials to expose portions of the first wiring structure and the substrate, forming a second wiring material that is overlying the second dielectric material and fills the opening region to form a vertical interconnect structure in the first peripheral region, and forming a second wiring structure from the second wiring material for a second array of devices, the first and second wiring structures being separated from each other and electrically connected by the vertical interconnect structure.
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