Invention Grant
- Patent Title: Terahertz investigative system and method
- Patent Title (中): 太赫兹调查系统和方法
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Application No.: US12358877Application Date: 2009-01-23
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Publication No.: US08399838B2Publication Date: 2013-03-19
- Inventor: Michael John Evans , Ian Stephen Gregory , Hideaki Page
- Applicant: Michael John Evans , Ian Stephen Gregory , Hideaki Page
- Applicant Address: GB Cambridge
- Assignee: TeraView Limited
- Current Assignee: TeraView Limited
- Current Assignee Address: GB Cambridge
- Agency: Dickstein Shapiro LLP
- Priority: GB0801318.7 20080124
- Main IPC: G01J5/02
- IPC: G01J5/02

Abstract:
A system for investigating a plurality of samples having varying positions or orientations moving with respect to the system, the system including an emitter of terahertz radiation for irradiating a sample provided in a sample space; a detector of terahertz radiation configured to detect radiation reflected from said sample space; and determining means to determine if radiation reflected from said sample space is from a sample with a predetermined orientation in the sample space.
Public/Granted literature
- US20090314944A1 TERAHERTZ INVESTIGATIVE SYSTEM AND METHOD Public/Granted day:2009-12-24
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