Invention Grant
- Patent Title: Neutron detector cell efficiency
- Patent Title (中): 中子检测器电池效率
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Application No.: US13424269Application Date: 2012-03-19
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Publication No.: US08399845B2Publication Date: 2013-03-19
- Inventor: Paul S. Fechner , David O. Erstad , Todd A. Randazzo , Bradley J. Larsen
- Applicant: Paul S. Fechner , David O. Erstad , Todd A. Randazzo , Bradley J. Larsen
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Shumaker & Sieffert, P.A.
- Main IPC: G01T3/00
- IPC: G01T3/00

Abstract:
Neutron detection cells and corresponding methods of detecting charged particles that make efficient use of silicon area are set forth. Three types of circuit cells/arrays are described: state latching circuits, glitch generating cells, and charge loss circuits. An array of these cells, used in conjunction with a neutron conversion film, increases the area that is sensitive to a strike by a charged particle over that of an array of SRAM cells. The result is a neutron detection cell that uses less power, costs less, and is more suitable for mass production.
Public/Granted literature
- US20120228513A1 NEUTRON DETECTOR CELL EFFICIENCY Public/Granted day:2012-09-13
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