Invention Grant
- Patent Title: Radiation efficiency measuring apparatus and radiation efficiency measuring method
- Patent Title (中): 辐射效率测量仪和辐射效率测量方法
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Application No.: US12606850Application Date: 2009-10-27
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Publication No.: US08400366B2Publication Date: 2013-03-19
- Inventor: Hiroshi Kitada
- Applicant: Hiroshi Kitada
- Applicant Address: JP
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP
- Agency: Studebaker & Brackett PC
- Agent Tim L. Brackett, Jr.; John F. Guay
- Priority: JP2007-122448 20070507
- Main IPC: G01R29/10
- IPC: G01R29/10

Abstract:
A target antenna 4A to be measured and a measuring antenna 5 are placed within an anechoic chamber 1. A first azimuth angle plane radiation pattern S21(R,θ,φ) is measured using a network analyzer 7 with an elevation angle φ of the target antenna 4A fixed to a first angle φ1. Next, a second azimuth angle plane radiation pattern S21(R,θ,φ) is measured using the network analyzer 7 with the elevation angle φ of the target antenna 4A fixed to a second angle φ2 different from the first angle φ1 by 90 degrees. A radiation efficiency of the target antenna 4A is measured by integrating in a spherical shape the azimuth angle plane radiation patterns S21(R,θ,φ) at two planes.
Public/Granted literature
- US20100045543A1 RADIATION EFFICIENCY MEASURING APPARATUS AND RADIATION EFFICIENCY MEASURING METHOD Public/Granted day:2010-02-25
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