Invention Grant
US08400622B2 Enhanced OTDR sensitivity by utilizing mode-field diameter measurements
有权
通过使用模场直径测量增强OTDR灵敏度
- Patent Title: Enhanced OTDR sensitivity by utilizing mode-field diameter measurements
- Patent Title (中): 通过使用模场直径测量增强OTDR灵敏度
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Application No.: US12640405Application Date: 2009-12-17
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Publication No.: US08400622B2Publication Date: 2013-03-19
- Inventor: Jonathan Nagel , Sheryl Woodward
- Applicant: Jonathan Nagel , Sheryl Woodward
- Applicant Address: US GA Atlanta
- Assignee: AT & T Intellectual Property I, LP
- Current Assignee: AT & T Intellectual Property I, LP
- Current Assignee Address: US GA Atlanta
- Agency: Fay Kaplun & Marcin, LLP
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
Described herein are systems and methods for enhancing sensitivity of an optical time-domain reflectometer (“OTDR”) using bi-directional analysis techniques. One embodiment of the disclosure of this application is related to a computer readable storage medium including a set of instructions that are executable by a processor. The set of instructions being operable to collect a first set of measurement data at a first resolution to provide a relative backscatter of the fiber, collect a second set of measurement data taken at a second resolution to calculate loss along the length of fiber, and combine the first set of measurement data with the second set of measurement data to calculate the loss along the fiber at the first resolution.
Public/Granted literature
- US20110149270A1 Enhanced OTDR Sensitivity by Utilizing Mode-Field Diameter Measurements Public/Granted day:2011-06-23
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