Invention Grant
- Patent Title: Method and device for the detection of defects in an object
- Patent Title (中): 用于检测物体中的缺陷的方法和装置
-
Application No.: US12874516Application Date: 2010-09-02
-
Publication No.: US08400630B2Publication Date: 2013-03-19
- Inventor: Marc Hemsendorf , Christian Probst
- Applicant: Marc Hemsendorf , Christian Probst
- Applicant Address: DE Neuried
- Assignee: GP Inspect GmbH
- Current Assignee: GP Inspect GmbH
- Current Assignee Address: DE Neuried
- Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- Priority: DE102009039685 20090902
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method for detecting defects in an object includes a step of locally illuminating the object by radiating in light having a wavelength to which the object is transparent. Multiply reflected components of the incident light are detected while the detection of directly transmitted components of the incident light is at least partly avoided and the detection of singly reflected components of the incident light is at least partly avoided. Defects are identified by evaluating intensity differences in the detected components of the incident light. There is also disclosed a device for carrying out the method.
Public/Granted literature
- US20110058161A1 Method and Device for the Detection of Defects in an Object Public/Granted day:2011-03-10
Information query