Invention Grant
US08400630B2 Method and device for the detection of defects in an object 有权
用于检测物体中的缺陷的方法和装置

  • Patent Title: Method and device for the detection of defects in an object
  • Patent Title (中): 用于检测物体中的缺陷的方法和装置
  • Application No.: US12874516
    Application Date: 2010-09-02
  • Publication No.: US08400630B2
    Publication Date: 2013-03-19
  • Inventor: Marc HemsendorfChristian Probst
  • Applicant: Marc HemsendorfChristian Probst
  • Applicant Address: DE Neuried
  • Assignee: GP Inspect GmbH
  • Current Assignee: GP Inspect GmbH
  • Current Assignee Address: DE Neuried
  • Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
  • Priority: DE102009039685 20090902
  • Main IPC: G01N21/00
  • IPC: G01N21/00
Method and device for the detection of defects in an object
Abstract:
A method for detecting defects in an object includes a step of locally illuminating the object by radiating in light having a wavelength to which the object is transparent. Multiply reflected components of the incident light are detected while the detection of directly transmitted components of the incident light is at least partly avoided and the detection of singly reflected components of the incident light is at least partly avoided. Defects are identified by evaluating intensity differences in the detected components of the incident light. There is also disclosed a device for carrying out the method.
Public/Granted literature
Information query
Patent Agency Ranking
0/0