Invention Grant
US08400824B2 Non-volatile memory device and method for controlling the same 有权
非易失性存储器件及其控制方法

  • Patent Title: Non-volatile memory device and method for controlling the same
  • Patent Title (中): 非易失性存储器件及其控制方法
  • Application No.: US12980252
    Application Date: 2010-12-28
  • Publication No.: US08400824B2
    Publication Date: 2013-03-19
  • Inventor: Kwang Myoung Rho
  • Applicant: Kwang Myoung Rho
  • Applicant Address: KR Icheon
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Icheon
  • Priority: KR10-2010-0124843 20101208
  • Main IPC: G11C11/00
  • IPC: G11C11/00
Non-volatile memory device and method for controlling the same
Abstract:
A non-volatile memory and method for controlling the same prevents a faulty operation from being generated in a read operation, resulting in increase in operation reliability. The non-volatile memory device includes a cell array configured to include a plurality of unit cells in which a read or write operation of data is achieved in a unit cell in response to a variation of resistance, a reference cell array configured to include a plurality of reference cells, each of which has the same structure as that of the unit cell, a global reference current generation circuit configured to generate a global reference current corresponding to a position of the reference cell so as to verify data stored in the reference cell array, and a sense-amplifier configured to compare a current flowing in the reference cell array with the global reference current during a write verification operation of the reference cell array, and thus sense data.
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