Invention Grant
US08400857B2 Circuit for sensing the content of a semiconductor memory cell 有权
用于感测半导体存储单元的内容的电路

  • Patent Title: Circuit for sensing the content of a semiconductor memory cell
  • Patent Title (中): 用于感测半导体存储单元的内容的电路
  • Application No.: US13056372
    Application Date: 2009-07-27
  • Publication No.: US08400857B2
    Publication Date: 2013-03-19
  • Inventor: William Redman-White
  • Applicant: William Redman-White
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP08104890.2 20080728
  • International Application: PCT/IB2009/053263 WO 20090727
  • International Announcement: WO2010/013192 WO 20100204
  • Main IPC: G11C7/00
  • IPC: G11C7/00 G11C7/02
Circuit for sensing the content of a semiconductor memory cell
Abstract:
A sensing circuit (100) for sensing the content of a memory cell (101), wherein the sensing circuit comprises a sense node (103) connectable to the memory cell (101) so that a signal indicative of the content of the memory cell (101) is providable to the sense node (103). The sensing circuit (100) further comprises a logic gate (102) having a first input, a second input and an output, wherein a reference signal (105) is providable to the first input and wherein the sense node (103) is coupled to the second input. The sensing circuit (100) further comprises a feedback loop (104) for coupling the output of the logic gate (102) to the second input of the logic gate (102) so that, during sensing the content of the memory cell (101), an electrical potential at the sense node (103) is used to make a decision but after a result is obtained, the memory and sense amplifier combination are configured so that the result is held indefinitely and so that no static current continues to flow.
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