Invention Grant
- Patent Title: Test table creation system and test table creation method
- Patent Title (中): 测试表创建系统和测试表创建方法
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Application No.: US12796742Application Date: 2010-06-09
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Publication No.: US08401813B2Publication Date: 2013-03-19
- Inventor: Shinichiro Tsudaka
- Applicant: Shinichiro Tsudaka
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Company
- Current Assignee: Mitsubishi Electric Company
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-287605 20091218
- Main IPC: G01D3/00
- IPC: G01D3/00

Abstract:
The objective of the present invention is to efficiently create a test table in a monitoring control system.There are provided a logic drawing analysis unit (20) that analyzes a logic drawing (LG1) stored in a logic drawing storage device (1); an input value creation unit (8) that creates an input value for each of the input value types into which analogue values are categorized, based on an input point (11) of the logic drawing (LG1) derived by the logic drawing analysis unit (20) and an input specification (ITB1) for the logic drawing (LG1) stored in an input specification storage device (2); an output value creation unit (6) that creates the respective expected values corresponding to the input values created in the input value creation unit (8), for the output points (15, 18) that correspond to the types of arithmetic elements derived by the logic drawing analysis unit (20); and a table creation unit (9) that creates a test table (TTB1), based on the input value created by the input value creation unit (8) and the expected value created by the output value creation unit (6).
Public/Granted literature
- US20110153258A1 TEST TABLE CREATION SYSTEM AND TEST TABLE CREATION METHOD Public/Granted day:2011-06-23
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