Invention Grant
- Patent Title: Debug message generation using a selected address type
- Patent Title (中): 使用所选地址类型调试消息生成
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Application No.: US12179632Application Date: 2008-07-25
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Publication No.: US08402258B2Publication Date: 2013-03-19
- Inventor: William C. Moyer
- Applicant: William C. Moyer
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F9/00
- IPC: G06F9/00 ; G06F11/36
Abstract:
A method for generating a debug message includes receiving a translated address and an untranslated address associated with a same processor operation, determining a value of one or more control indicators, selecting the translated address or the untranslated address as a selected address based on the value of the one or more control indicators, and creating a debug message using at least a portion of the selected address.
Public/Granted literature
- US20100023735A1 DEBUG MESSAGE GENERATION USING A SELECTED ADDRESS TYPE Public/Granted day:2010-01-28
Information query
