Invention Grant
US08402316B2 Method of testing computer, computer test apparatus and non-transitory computer-readable medium
失效
计算机，计算机测试仪器和非暂时性计算机可读介质测试方法
- Patent Title: Method of testing computer, computer test apparatus and non-transitory computer-readable medium
- Patent Title (中): 计算机，计算机测试仪器和非暂时性计算机可读介质测试方法
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Application No.: US13086012Application Date: 2011-04-13
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Publication No.: US08402316B2Publication Date: 2013-03-19
- Inventor: Fumio Ichikawa , Tamoru Inoue
- Applicant: Fumio Ichikawa , Tamoru Inoue
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2010-125148 20100531
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A method of testing a computer, the method has designating a register as an input-only register having a setting of a value which does not cause an exception interruption with an execution of a specific type of instruction, generating a test instruction array having a plurality of instructions for a test, by assigning a register excluding the input-only register as an output destination of an execution result of each of the plurality of instructions, executing the plurality of instructions included in the generated test instruction array, and evaluating the execution results by the computer.
Public/Granted literature
- US20110296147A1 METHOD OF TESTING COMPUTER, COMPUTER TEST APPARATUS AND NON-TRANSITORY COMPUTER-READABLE MEDIUM Public/Granted day:2011-12-01
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