Invention Grant
- Patent Title: Single crystal silicon pulling apparatus, method for preventing contamination of silicon melt, and device for preventing contamination of silicon melt
- Patent Title (中): 单晶硅提拉装置,防止硅熔体污染的方法,以及防止硅熔体污染的装置
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Application No.: US11992278Application Date: 2006-06-27
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Publication No.: US08404046B2Publication Date: 2013-03-26
- Inventor: Makato Kamogawa , Koichi Shimomura , Yoshiyuki Suzuki , Daisuke Ebi
- Applicant: Makato Kamogawa , Koichi Shimomura , Yoshiyuki Suzuki , Daisuke Ebi
- Applicant Address: JP Nagasaki
- Assignee: Sumco Techxiv Corporation
- Current Assignee: Sumco Techxiv Corporation
- Current Assignee Address: JP Nagasaki
- Agency: Husch Blackwell LLP
- Priority: JP2005-279979 20050927
- International Application: PCT/JP2006/312791 WO 20060627
- International Announcement: WO2007/037052 WO 20070405
- Main IPC: C30B35/00
- IPC: C30B35/00 ; C30B15/00

Abstract:
A velocity of Ar gas flow passing through between a lower end of a cylindrical body and a thermal shielding body is influenced by arrangement of a pulling path of single crystal silicon, a cylindrical body, and a thermal shielding body. Accordingly, the velocity of the Ar gas flow passing through between a lower end of the cylindrical body and the thermal shielding body is controlled by adjusting a relative position of the pulling path of the single crystal silicon, the cylindrical body, and the thermal shielding body. As described above, dust falling off to silicon melt can be reduced, thereby preventing deterioration in quality of the single crystal silicon.
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