Invention Grant
- Patent Title: Atomic magnetometer and magnetic sensing method
- Patent Title (中): 原子磁强计和磁感测方法
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Application No.: US12740059Application Date: 2008-12-26
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Publication No.: US08405389B2Publication Date: 2013-03-26
- Inventor: Hideyuki Sugioka , Sunao Ichihara
- Applicant: Hideyuki Sugioka , Sunao Ichihara
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2007-340474 20071228
- International Application: PCT/JP2008/073964 WO 20081226
- International Announcement: WO2009/084731 WO 20090709
- Main IPC: G01R33/02
- IPC: G01R33/02

Abstract:
An atomic magnetometer includes a light source for a probe beam and a medium in which the probe beam is to be propagated. The medium is a substance which changes a polarization rotation angle of the probe beam depending on a magnetic field intensity at a first measurement position and a magnetic field intensity at a second measurement position different from the first measurement position. The atomic magnetometer directly measures a difference between the magnetic field intensity at the first measurement position and the magnetic field intensity at the second measurement position as a difference in polarization rotation angle, along a propagation path of the probe beam.
Public/Granted literature
- US20110193555A1 ATOMIC MAGNETOMETER AND MAGNETIC SENSING METHOD Public/Granted day:2011-08-11
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