Invention Grant
- Patent Title: Wideband I-V probe and method
- Patent Title (中): 宽带I-V探头和方法
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Application No.: US12656203Application Date: 2010-01-21
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Publication No.: US08405405B2Publication Date: 2013-03-26
- Inventor: Christos Tsironis , Zacharia Ouardirhi
- Applicant: Christos Tsironis , Zacharia Ouardirhi
- Main IPC: G01R27/04
- IPC: G01R27/04

Abstract:
Low loss current and voltage probes are integrated in parallel plate airlines (slablines) to be used either as separate modules inserted between tuner and DUT in load pull test setups, or integrated in the impedance tuners themselves. The probes are inserted orthogonally at exactly the same reference plane relative to the DUT, maximizing bandwidth and the minimizing deformation of the detected electric and magnetic fields. The probes are used to detect the actual voltage and current waveforms and feed into an amplitude-and-phase calibrated high speed oscilloscope, including several harmonic frequencies. The actual real time voltage and current time domain waves are transformed into the frequency domain using fast Fourier transformation (FFT), de-embedded to the DUT reference plane and inverse transformed into the time domain using inverse Fourier transformation (FFT−1). The result of this real-time operation is the actual dynamic load line of the DUT at its terminals.
Public/Granted literature
- US20110204906A1 Wideband I-V probe and method Public/Granted day:2011-08-25
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