Invention Grant
- Patent Title: Optical signal quality monitoring
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Application No.: US12385140Application Date: 2009-03-31
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Publication No.: US08405511B2Publication Date: 2013-03-26
- Inventor: Hitoshi Takeshita
- Applicant: Hitoshi Takeshita
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2008-110095 20080421
- Main IPC: G08B17/12
- IPC: G08B17/12

Abstract:
An optical signal quality monitoring apparatus includes a trajectory length acquirer measuring a Stokes vector of an optical transmission signal over an optical signal modulation frequency band and acquiring the length of a trajectory in the optical signal modulation frequency band traced out on a Poincare sphere by the measured Stokes vector as the measurement value; a DGD acquirer acquiring a DGD value of the optical transmission signal the Stokes vector of which is measured by the trajectory length acquirer; and a quality value estimator estimating a quality value by using the length of the trajectory acquired by the trajectory length acquirer and the DGD value acquired by the DGD acquirer.
Public/Granted literature
- US20090267778A1 Optical signal quality monitoring Public/Granted day:2009-10-29
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