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US08406049B2 Nonvolatile semiconductor memory device and writing method thereof 失效
非易失性半导体存储器件及其写入方法

Nonvolatile semiconductor memory device and writing method thereof
Abstract:
A control circuit is configured to execute a writing operation for giving a second threshold voltage distribution to a plurality of memory cells formed along one word line. In the writing operation, the control circuit performs a writing operation by executing a voltage applying operation in memory cells to be given the second threshold voltage distribution. While the control circuit executes a voltage applying operation in memory cells to be maintained in an erased state, thereby moving a first threshold voltage distribution to a positive direction to obtain a third threshold voltage distribution representing the erased state.
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