Invention Grant
- Patent Title: Modulation apparatus, test apparatus and correction method
- Patent Title (中): 调制装置，试验装置及校正方法
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Application No.: US12505804Application Date: 2009-07-20
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Publication No.: US08406283B2Publication Date: 2013-03-26
- Inventor: Go Utamaru
- Applicant: Go Utamaru
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04L27/36 ; H01Q11/12
Abstract:
Provided is a modulation apparatus that quadrature modulates a periodic signal, comprising an I-side signal output section that outputs an I-component signal; a Q-side signal output section that outputs a Q-component signal; a quadrature modulator that quadrature modulates the periodic signal with the I-component signal and the Q-component signal; an I-side correcting section that corrects the I-component signal according to an error of the quadrature modulator; and a Q-side correcting section that corrects the Q-component signal according to the error of the quadrature modulator.
Public/Granted literature
- US20110013682A1 MODULATION APPARATUS, TEST APPARATUS AND CORRECTION METHOD Public/Granted day:2011-01-20
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