Invention Grant
US08406486B2 Inter-pattern feature corresponding device, inter-pattern feature corresponding method used for the same, and program therefor 有权
Inter-pattern特征对应的设备,相互间的模式间特征对应的方法及其程序

  • Patent Title: Inter-pattern feature corresponding device, inter-pattern feature corresponding method used for the same, and program therefor
  • Patent Title (中): Inter-pattern特征对应的设备,相互间的模式间特征对应的方法及其程序
  • Application No.: US12809287
    Application Date: 2008-12-19
  • Publication No.: US08406486B2
    Publication Date: 2013-03-26
  • Inventor: Huang Lei
  • Applicant: Huang Lei
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Priority: JP2007-333390 20071226
  • International Application: PCT/JP2008/073204 WO 20081219
  • International Announcement: WO2009/081866 WO 20090702
  • Main IPC: G06K9/00
  • IPC: G06K9/00 G06K9/46 G06K9/66 G06K9/62
Inter-pattern feature corresponding device, inter-pattern feature corresponding method used for the same, and program therefor
Abstract:
To provide an inter-pattern feature corresponding device (1) for determining a feature correspondence relationship with high accuracy even if a pattern to be collated has distortion. The inter-pattern feature corresponding device (1) includes a means (11) for generating a proximity feature point group in which the feature points are positionally proximate to each other in a pattern and a location relationship numeric number group indicating the location relationship between the feature points of the proximity feature point group as feature point group locations, a means (12) for comparing the generated location relationship numeric numbers to detect the corresponding feature point group location candidates, a means (13) for comparing the location relationship numeric numbers between a feature point of each feature point group location of the corresponding feature point group location candidates and feature points which are proximate to the feature point group locations, adding the corresponding proximity feature points to the corresponding feature point group location candidates, and updating the corresponding feature point group location candidates, a means (14) for examining the associated corresponding feature point candidates of the updated corresponding feature point group location candidates to set the associated corresponding feature points of the corresponding feature point group location candidates, and a means (15) for examining the corresponding feature point group location candidates to set inter-pattern corresponding feature points.
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