Invention Grant
- Patent Title: Power control using in-situ test circuit to measure performance capability of processing circuitry
- Patent Title (中): 功率控制使用原位测试电路来测量处理电路的性能
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Application No.: US12521063Application Date: 2006-12-27
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Publication No.: US08407498B2Publication Date: 2013-03-26
- Inventor: Mike Jager
- Applicant: Mike Jager
- Applicant Address: FI Espoo
- Assignee: Nokia Corporation
- Current Assignee: Nokia Corporation
- Current Assignee Address: FI Espoo
- Agency: Locke Lord LLP
- International Application: PCT/IB2006/003820 WO 20061227
- International Announcement: WO2008/078131 WO 20080703
- Main IPC: G06F1/32
- IPC: G06F1/32
Abstract:
A method comprising: sensing an ambient temperature at an electronic apparatus; and switching between a first processing mode of the electronic apparatus and a second processing mode of the electronic device, in response to an increase in the ambient temperature above a threshold.
Public/Granted literature
- US20100146313A1 POWER CONTROL Public/Granted day:2010-06-10
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