Invention Grant
- Patent Title: Leak current calculation apparatus and method for calculating leak current
- Patent Title (中): 泄漏电流计算装置及泄漏电流计算方法
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Application No.: US12720033Application Date: 2010-03-09
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Publication No.: US08407642B2Publication Date: 2013-03-26
- Inventor: Yuzi Kanazawa
- Applicant: Yuzi Kanazawa
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2009-065123 20090317
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/00 ; G01R19/00 ; G01R27/28 ; G01R31/00

Abstract:
A leak current calculation apparatus includes an acquiring section for acquiring partial circuit information, and a grouping section for forming a plurality of groups each comprising a part of the partial circuits connected with each other and for generating group information. The apparatus includes a leak difference value calculating section for calculating a leak difference value, which is a difference between a provisional maximum value acquired by adding up the maximum values of the leak current values of all the partial circuits and a sum of maximum values of the leak current values contained in the group information of the groups, and a maximum leak current calculating section for calculating the maximum leak current value of the integrated circuit by adjusting the provisional maximum value with the leak difference value.
Public/Granted literature
- US20100237878A1 LEAK CURRENT CALCULATION APPARATUS AND METHOD FOR CALCULATING LEAK CURRENT Public/Granted day:2010-09-23
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