Invention Grant
- Patent Title: Window frame deflection measurement device and method of use
- Patent Title (中): 窗框偏转测量装置及其使用方法
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Application No.: US13199025Application Date: 2011-08-17
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Publication No.: US08407906B2Publication Date: 2013-04-02
- Inventor: Daniel Heyer
- Applicant: Daniel Heyer
- Applicant Address: US TX Lewisville
- Assignee: Cunningham Lindsey U.S., Inc.
- Current Assignee: Cunningham Lindsey U.S., Inc.
- Current Assignee Address: US TX Lewisville
- Agency: Shultz & Associates, P.C.
- Main IPC: G01C9/00
- IPC: G01C9/00 ; G01B5/20

Abstract:
A portable device for measuring deflection of a surface, comprising an elongate frame having a first end and a second end and a first datum surface, a first removable reference assembly adjacent the first end, a second removable reference adjacent the second end, a deflection gauge attached to the elongate frame between the first removable reference assembly and the second removable reference assembly, and wherein the deflection gauge engages and measures a deflection of the surface relative to the first removable reference assembly and the second removable reference assembly.
Public/Granted literature
- US20120042530A1 Window frame deflection measurement device and method of use Public/Granted day:2012-02-23
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