Invention Grant
US08408063B2 Ultrasonic probe, and ultrasonic diagnostic apparatus using the same
有权
超声波探头和使用其的超声波诊断装置
- Patent Title: Ultrasonic probe, and ultrasonic diagnostic apparatus using the same
- Patent Title (中): 超声波探头和使用其的超声波诊断装置
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Application No.: US12744020Application Date: 2008-11-21
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Publication No.: US08408063B2Publication Date: 2013-04-02
- Inventor: Shuzo Sano , Makoto Fukada , Akifumi Sako
- Applicant: Shuzo Sano , Makoto Fukada , Akifumi Sako
- Applicant Address: JP Tokyo
- Assignee: Hitachi Medical Corporation
- Current Assignee: Hitachi Medical Corporation
- Current Assignee Address: JP Tokyo
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2007-308118 20071129
- International Application: PCT/JP2008/071239 WO 20081121
- International Announcement: WO2009/069555 WO 20090604
- Main IPC: G01N29/00
- IPC: G01N29/00

Abstract:
An ultrasonic probe including a cMUT chip that has plural oscillation elements whose electromechanical coupling coefficient or sensitivity varies in accordance with a bias voltage and transmits/receives an ultrasonic wave, an acoustic lens provided at an ultrasonic wave transmission/reception side of the cMUT chip, a backing layer provided to the opposite surface of the cMUT chip to the acoustic lens, and a substrate provided between the backing layer and the cMUT chip. The ultrasonic probe further includes thermal stress suppressing means for suppressing thermal stress occurring due to the difference in linear expansion coefficient caused by temperature variation between the substrate and the backing layer.
Public/Granted literature
- US20100242612A1 ULTRASONIC PROBE, AND ULTRASONIC DIAGNOSTIC APPARATUS USING THE SAME Public/Granted day:2010-09-30
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