Invention Grant
- Patent Title: Method and apparatus for sensing applied forces
- Patent Title (中): 用于感测施加力的方法和装置
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Application No.: US10553892Application Date: 2003-09-22
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Publication No.: US08408077B2Publication Date: 2013-04-02
- Inventor: Mark Anthony Darty , Mohamadinejad Habib
- Applicant: Mark Anthony Darty , Mohamadinejad Habib
- Applicant Address: US NJ Bridgewater
- Assignee: Brother International Corporation
- Current Assignee: Brother International Corporation
- Current Assignee Address: US NJ Bridgewater
- Agency: Frommer Lawrence & Haug LLP
- International Application: PCT/US03/12536 WO 20030922
- International Announcement: WO2005/038468 WO 20050428
- Main IPC: G01L1/00
- IPC: G01L1/00

Abstract:
An apparatus for sensing a force. The apparatus includes a nanostructure being suitable for emitting electrons and a collector. The collector is proximately positioned with respect to the nanostructure so as to receive the emitted electrons and define a gap therebetween. The gap is partially dependent upon the applied force and the emission and reception of the electrons are indicative of the applied force.
Public/Granted literature
- US20110094315A1 Method and apparatus for sensing applied forces Public/Granted day:2011-04-28
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