Invention Grant
US08410415B2 Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector
有权
用于质谱的离子检测器,用于检测离子的方法和用于制造离子检测器的方法
- Patent Title: Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector
- Patent Title (中): 用于质谱的离子检测器,用于检测离子的方法和用于制造离子检测器的方法
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Application No.: US13279081Application Date: 2011-10-21
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Publication No.: US08410415B2Publication Date: 2013-04-02
- Inventor: Megumi Nakamura , Yoshiro Shiokawa , Qiang Peng
- Applicant: Megumi Nakamura , Yoshiro Shiokawa , Qiang Peng
- Applicant Address: JP Kawasaki-shi, Kanagawa
- Assignee: Canon Anelva Corporation
- Current Assignee: Canon Anelva Corporation
- Current Assignee Address: JP Kawasaki-shi, Kanagawa
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Main IPC: H01J43/06
- IPC: H01J43/06 ; H01J43/10 ; H01J40/06

Abstract:
The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector.
Public/Granted literature
- US20120097847A1 ION DETECTOR FOR MASS SPECTROMETRY, METHOD FOR DETECTING ION, AND METHOD FOR MANUFACTURING ION DETECTOR Public/Granted day:2012-04-26
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