Invention Grant
US08410415B2 Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector 有权
用于质谱的离子检测器,用于检测离子的方法和用于制造离子检测器的方法

Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detector
Abstract:
The present disclosure provides an ion detector for improving the effect of electric field for pulling in an ion to be detected to a first-stage electrode of a secondary electron multiplier (SEM), and improving the effect of a stray light reduction. In one example embodiment, an ion detector includes a SEM, and a lead-in electrode for pulling in an ion to a first-stage electrode side of the SEM. At least one of the area of the lead-in electrode and a potential difference between the lead-in electrode and neighboring electrodes of the lead-in electrode, the neighboring electrode being an electrode not of the SEM, is set so that the light amount of internal-stray light generated inside the detector entering the first-stage electrode is not more than that of external-stray light generated outside the detector entering the first-stage electrode, when an ion is introduced into the detector.
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