Invention Grant
- Patent Title: Sample transfer device and sample transferring method
- Patent Title (中): 样品转印装置和样品转印方法
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Application No.: US13015115Application Date: 2011-01-27
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Publication No.: US08410457B2Publication Date: 2013-04-02
- Inventor: Shohei Terada , Tatsumi Hirano , Koichi Watanabe , Yasuichiro Watanabe , Hiromitsu Seino
- Applicant: Shohei Terada , Tatsumi Hirano , Koichi Watanabe , Yasuichiro Watanabe , Hiromitsu Seino
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2010-016146 20100128
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A sample transfer device is provided which can insert to a charged particle beam apparatus a sample to be observed and analyzed under irradiation of a charged particle beam while suppressing to a minimum the time to expose the sample to the atmospheric environment. The sample transfer device for transferring the sample to be observed and analyzed by irradiating the charged particle beam comprises an expansible hollow member capable of accommodating a sample holder mounting the sample, a fixing member for fixing the sample holder within the expansible hollow member, and a sealing member communicating with the interior of the expansible hollow member to open/close an opening through which the sample holder passes.
Public/Granted literature
- US20110180724A1 SAMPLE TRANSFER DEVICE AND SAMPLE TRANSFERRING METHOD Public/Granted day:2011-07-28
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