Invention Grant
- Patent Title: Magnetic random access memory and method of fabricating the same
- Patent Title (中): 磁性随机存取存储器及其制造方法
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Application No.: US13234608Application Date: 2011-09-16
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Publication No.: US08410529B2Publication Date: 2013-04-02
- Inventor: Daisuke Ikeno , Koji Yamakawa , Katsuaki Natori , Yasuyuki Sonoda
- Applicant: Daisuke Ikeno , Koji Yamakawa , Katsuaki Natori , Yasuyuki Sonoda
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: JPP2011-065284 20110324
- Main IPC: H01L29/66
- IPC: H01L29/66

Abstract:
According to one embodiment, a semiconductor device, includes a magneto resistive element including a first magnetic layer, a first interface magnetic layer, a nonmagnetic layer, a second interface magnetic layer and a second magnetic layer as a stacked structure in order; and a metal layer including first metal atoms, second metal atoms and boron atoms, the metal layer being provided at least one region selected from under the first magnetic, between the first magnetic layer and the first interface magnetic layer, between the second interface magnetic layer and the second magnetic layer, and upper the second magnetic layer.
Public/Granted literature
- US20120241879A1 MAGNETIC RANDOM ACCESS MEMORY AND METHOD OF FABRICATING THE SAME Public/Granted day:2012-09-27
Information query
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