Invention Grant
- Patent Title: Impulse immunity test apparatus
- Patent Title (中): 脉冲免疫测试仪
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Application No.: US12530168Application Date: 2008-03-06
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Publication No.: US08410791B2Publication Date: 2013-04-02
- Inventor: Tsuneo Tsukagoshi , Takeshi Watanabe , Toshiyuki Nakaie , Nobuchika Matsui
- Applicant: Tsuneo Tsukagoshi , Takeshi Watanabe , Toshiyuki Nakaie , Nobuchika Matsui
- Applicant Address: JP Tokyo JP Kanagawa JP Wakayama
- Assignee: NEC Corporation,Renesas Electronics Corporation,Hanwa Electronic Ind. Co., Ltd.
- Current Assignee: NEC Corporation,Renesas Electronics Corporation,Hanwa Electronic Ind. Co., Ltd.
- Current Assignee Address: JP Tokyo JP Kanagawa JP Wakayama
- Agency: Sughrue Mion, PLLC
- Priority: JP2007-055153 20070306
- International Application: PCT/JP2008/054558 WO 20080306
- International Announcement: WO2008/108503 WO 20080912
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R27/26

Abstract:
The application methods in the related art cannot apply a sufficient voltage with a rectangular wave having a short rise time to an electronic circuit. Furthermore, electrostatic discharge test can apply a sufficient voltage but can only apply an oscillating waveform.A TLP generator is used as a rectangular wave generator. The sum of an injection resistance and a matching resistance is set so as to match the characteristic impedance of a transmission line for transmitting a rectangular wave to a test target. A capacitor is connected to a return line of the applied rectangular wave. With this configuration, stable application can be achieved. An error observation function of an electronic circuit gradually increases a peak value of the rectangular wave and determines the immunity based on an application voltage to cause an error for the first time.
Public/Granted literature
- US20100090710A1 IMPULSE IMMUNITY TEST APPARATUS Public/Granted day:2010-04-15
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