Invention Grant
- Patent Title: Method and device for measuring a radiation field
- Patent Title (中): 用于测量辐射场的方法和装置
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Application No.: US12938972Application Date: 2010-11-03
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Publication No.: US08410987B2Publication Date: 2013-04-02
- Inventor: Thomas Eibert , Torsten Fritzel , Carsten Schmidt , Hans-Juergen Steiner
- Applicant: Thomas Eibert , Torsten Fritzel , Carsten Schmidt , Hans-Juergen Steiner
- Applicant Address: DE Taufkirchen
- Assignee: Astrium GmbH
- Current Assignee: Astrium GmbH
- Current Assignee Address: DE Taufkirchen
- Agency: Crowell & Moring LLP
- Priority: DE102009051969 20091104
- Main IPC: G01R29/10
- IPC: G01R29/10

Abstract:
A method for measuring a radiation field in the direct vicinity of a measured object is provided. One or more antenna measurement probe(s) are moved in any desired fashion within the radiation field, and a number of high-frequency measurement points is thus recorded. During the movement of the antenna measurement probe, a position determination of a respective antenna measurement probe is conducted simultaneously with or in close temporal proximity to the capture of a respective high-frequency measurement point, in order to assign a position to each high-frequency measurement point so as to generate a spatially defined measurement point cloud. Finally, radiation patterns at any distance from the measured object may be determined from the spatial measurement point cloud by means of a field transformation method.
Public/Granted literature
- US20110102277A1 Method and Device for Measuring a Radiation Field Public/Granted day:2011-05-05
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