Invention Grant
- Patent Title: Solid-state imaging device and image defect correction processing circuit
- Patent Title (中): 固态成像装置和图像缺陷校正处理电路
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Application No.: US12823646Application Date: 2010-06-25
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Publication No.: US08411175B2Publication Date: 2013-04-02
- Inventor: Ryuki Sato , Junichi Hosokawa
- Applicant: Ryuki Sato , Junichi Hosokawa
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-157116 20090701
- Main IPC: H04N5/217
- IPC: H04N5/217

Abstract:
According to one embodiment, an image defect correction processing circuit includes a signal level comparator circuit and a defect correction circuit. The signal level comparator circuit extracts the maximum signal level and the minimum signal level from a plurality of pixel signals existing around a correction target pixel. The defect correction circuit executes defect corrections with respect to the correction target pixel.
Public/Granted literature
- US20110001853A1 SOLID-STATE IMAGING DEVICE AND IMAGE DEFECT CORRECTION PROCESSING CIRCUIT Public/Granted day:2011-01-06
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