Invention Grant
US08411284B2 Method for simultaneous hue phase-shifting and system for 3-D surface profilometry using the same
失效
同时色相移相方法及使用该方法的三维曲面轮廓测定系统
- Patent Title: Method for simultaneous hue phase-shifting and system for 3-D surface profilometry using the same
- Patent Title (中): 同时色相移相方法及使用该方法的三维曲面轮廓测定系统
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Application No.: US12512713Application Date: 2009-07-30
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Publication No.: US08411284B2Publication Date: 2013-04-02
- Inventor: Liang-Chia Chen , Yao-Sheng Shu
- Applicant: Liang-Chia Chen , Yao-Sheng Shu
- Applicant Address: TW Taipei
- Assignee: National Taipei University of Technology
- Current Assignee: National Taipei University of Technology
- Current Assignee Address: TW Taipei
- Agency: Morris Manning & Martin LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: TW98102818A 20090123
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
The present invention provides a method for simultaneous hue phase-shifting and a system for 3-D surface profilometry, wherein a single structured-light fringe pattern with encoded multiple trapezoidal color fringes is projected on an object so as to obtain a color image having deformed fringe patterns and then a hue information extracted from a HSI color model associated with the fringe pattern is transformed into a hue phase-shifting information for restructuring the 3-D surface profile of the object. Since the color structured light is composed of a plurality of colorful light having phase shifts with each other in spatial domain, the single structured-light pattern comprises multiple hue phase-shifting information so that the phase shifting and unwrapping can be performed by one-shot 3-D surface reconstruction process without needs of traditional conventional phase wrapping and Euler's transformation procedures such that the efficiency of phase shifting and 3-D surface measurement can be improved.
Public/Granted literature
- US20100188400A1 METHOD FOR SIMULTANEOUS HUE PHASE-SHIFTING AND SYSTEM FOR 3-D SURFACE PROFILOMETRY USING THE SAME Public/Granted day:2010-07-29
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