Invention Grant
- Patent Title: Spin-transfer torque memory self-reference read method
- Patent Title (中): 自旋转矩存储器自参考读取方式
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Application No.: US13349052Application Date: 2012-01-12
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Publication No.: US08411495B2Publication Date: 2013-04-02
- Inventor: Hai Li , Yiran Chen , Hongyue Liu , Kang Yong Kim , Dimitar V. Dimitrov , Henry F. Huang
- Applicant: Hai Li , Yiran Chen , Hongyue Liu , Kang Yong Kim , Dimitar V. Dimitrov , Henry F. Huang
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Agency: Mueting Raasch & Gebhardt PA
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A spin-transfer torque memory apparatus and self-reference read schemes are described. One method of self-reference reading a spin-transfer torque memory unit includes applying a first read current through a magnetic tunnel junction data cell and forming a first bit line read voltage, the magnetic tunnel junction data cell having a first resistance state and storing the first bit line read voltage in a first voltage storage device. Then applying a low resistance state polarized write current through the magnetic tunnel junction data cell, forming a low second resistance state magnetic tunnel junction data cell. A second read current is applied through the low second resistance state magnetic tunnel junction data cell to forming a second bit line read voltage. The second bit line read voltage is stored in a second voltage storage device. The method also includes comparing the first bit line read voltage with the second bit line read voltage to determine whether the first resistance state of the magnetic tunnel junction data cell was a high resistance state or low resistance state.
Public/Granted literature
- US20120106241A1 SPIN-TRANSFER TORQUE MEMORY SELF-REFERENCE READ METHOD Public/Granted day:2012-05-03
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