Invention Grant
- Patent Title: X-ray testing method and X-ray testing device
- Patent Title (中): X射线检测方法和X射线检测装置
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Application No.: US12093844Application Date: 2006-11-13
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Publication No.: US08411818B2Publication Date: 2013-04-02
- Inventor: Eckhard Leonhard Sperschneider , Jan Rimbach , Martin Sokolowski , Timothy John McGann
- Applicant: Eckhard Leonhard Sperschneider , Jan Rimbach , Martin Sokolowski , Timothy John McGann
- Applicant Address: DE Dachau
- Assignee: Matrix Technologies GmbH
- Current Assignee: Matrix Technologies GmbH
- Current Assignee Address: DE Dachau
- Agency: Millen, White, Zelano & Branigan, P.C.
- Priority: DE102005054979 20051116
- International Application: PCT/EP2006/010874 WO 20061113
- International Announcement: WO2007/057144 WO 20070524
- Main IPC: G01N23/02
- IPC: G01N23/02

Abstract:
A first x-ray image of the circuit board that is equipped with components only on a first side with a first x-ray device (2) that produces transmission images and a second x-ray image of a circuit board that is equipped with components on both sides with a second x-ray device (4) that produces transmission images are recorded in an x-ray testing method for checking circuit boards that are equipped with components on two sides, in particular for checking soldered joints. A test x-ray image is then evaluated in a computer unit in which the second side that is equipped with components is displayed in enhanced form by forming a function from the pixel values of the first x-ray image and the corresponding pixel values of the second x-ray image.
Public/Granted literature
- US20100290582A1 X-RAY TESTING METHOD AND X-RAY TESTING DEVICE Public/Granted day:2010-11-18
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