Invention Grant
US08411926B2 Calibration of a multi-pinhole SPECT system without pre-knowledge of point source markers 3D coordinates
有权
多针孔SPECT系统的校准,无需点源标记3D坐标的预先知识
- Patent Title: Calibration of a multi-pinhole SPECT system without pre-knowledge of point source markers 3D coordinates
- Patent Title (中): 多针孔SPECT系统的校准,无需点源标记3D坐标的预先知识
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Application No.: US12767414Application Date: 2010-04-26
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Publication No.: US08411926B2Publication Date: 2013-04-02
- Inventor: Bing Feng
- Applicant: Bing Feng
- Applicant Address: US PA Malvern
- Assignee: Siemens Medical Solutions USA, Inc.
- Current Assignee: Siemens Medical Solutions USA, Inc.
- Current Assignee Address: US PA Malvern
- Agent Peter Kendall
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A system and method is provided for reconstructing single photon emission computed tomography data acquired with a pinhole collimator without pre-knowledge of 3D coordinates of point source markers. The system and method include reiteratively applying a downhill simplex process to determine a first parameter and a second parameter, keeping a lowest vertex from a previous iteration, randomly resetting starting values for rest vertexes for a current iteration, wherein the lowest vertex is prevented from performing a last iteration, determining whether at least one of a first threshold and a second threshold has been reached, wherein the first threshold comprises a cost function value and the second threshold comprises a predetermined number of iterations of the downhill simplex process, acquiring projection data from the first parameter, determining locations of 2D data from the projection data of the first parameter; and estimating the second parameter by fitting the forward projected data locations to the measured data locations.
Public/Granted literature
- US20100272339A1 Calibration of a Multi-Pinhole SPECT System Without Pre-Knowledge of Point Source Markers 3D Coordinates Public/Granted day:2010-10-28
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