Invention Grant
US08411926B2 Calibration of a multi-pinhole SPECT system without pre-knowledge of point source markers 3D coordinates 有权
多针孔SPECT系统的校准,无需点源标记3D坐标的预先知识

  • Patent Title: Calibration of a multi-pinhole SPECT system without pre-knowledge of point source markers 3D coordinates
  • Patent Title (中): 多针孔SPECT系统的校准,无需点源标记3D坐标的预先知识
  • Application No.: US12767414
    Application Date: 2010-04-26
  • Publication No.: US08411926B2
    Publication Date: 2013-04-02
  • Inventor: Bing Feng
  • Applicant: Bing Feng
  • Applicant Address: US PA Malvern
  • Assignee: Siemens Medical Solutions USA, Inc.
  • Current Assignee: Siemens Medical Solutions USA, Inc.
  • Current Assignee Address: US PA Malvern
  • Agent Peter Kendall
  • Main IPC: G06K9/00
  • IPC: G06K9/00
Calibration of a multi-pinhole SPECT system without pre-knowledge of point source markers 3D coordinates
Abstract:
A system and method is provided for reconstructing single photon emission computed tomography data acquired with a pinhole collimator without pre-knowledge of 3D coordinates of point source markers. The system and method include reiteratively applying a downhill simplex process to determine a first parameter and a second parameter, keeping a lowest vertex from a previous iteration, randomly resetting starting values for rest vertexes for a current iteration, wherein the lowest vertex is prevented from performing a last iteration, determining whether at least one of a first threshold and a second threshold has been reached, wherein the first threshold comprises a cost function value and the second threshold comprises a predetermined number of iterations of the downhill simplex process, acquiring projection data from the first parameter, determining locations of 2D data from the projection data of the first parameter; and estimating the second parameter by fitting the forward projected data locations to the measured data locations.
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