Invention Grant
- Patent Title: Marker detection in X-ray images
- Patent Title (中): X射线图像中的标记检测
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Application No.: US12898018Application Date: 2010-10-05
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Publication No.: US08411927B2Publication Date: 2013-04-02
- Inventor: Ti-chiun Chang , Yunqiang Chen , Michelle xiaohong Yan , Tong Fang
- Applicant: Ti-chiun Chang , Yunqiang Chen , Michelle xiaohong Yan , Tong Fang
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Agency: F. Chau & Associates, LLC
- Agent Donald B. Paschburg
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method for detecting markers within X-ray images includes applying directional filters to a sequence of X-ray image frames. Marker candidate pixels are determined based on the output of the directional filters. Candidate pixels are grouped into clusters and distances between each possible pair of clusters is determined and the most frequently occurring distance is considered an estimated distance between markers. A first marker is detected at the cluster that most closely resembles a marker based on certain criteria and a second marker is then detected at a cluster that is the estimated distance from the first marker. The pair of first and second marker detections is scored to determine detection quality. If the detected marker pair has an acceptable score then the detected marker pair is used.
Public/Granted literature
- US20110103674A1 MARKER DETECTION IN X-RAY IMAGES Public/Granted day:2011-05-05
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