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US08411928B2 Scatterometry method and device for inspecting patterned medium 失效
用于检查图案化介质的散射法和装置

Scatterometry method and device for inspecting patterned medium
Abstract:
An inspection region is specified using the design information to perform region division for measurement through a scatterometry method. The obtained detection data is classified by pattern into a periodic region and a non-periodic region. A spectroscopic characteristic is detected by an optical sensor to extract features. The extracted features are compared with features stored in a feature map database for each region to evaluate a state of a patterned medium.
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