Invention Grant
US08412110B2 Apparatus and method for determining multi-antenna radiated performance of wireless devices
失效
用于确定无线设备的多天线辐射性能的装置和方法
- Patent Title: Apparatus and method for determining multi-antenna radiated performance of wireless devices
- Patent Title (中): 用于确定无线设备的多天线辐射性能的装置和方法
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Application No.: US12848637Application Date: 2010-08-02
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Publication No.: US08412110B2Publication Date: 2013-04-02
- Inventor: Gregory A. Breit , Dennis M. Feenaghty
- Applicant: Gregory A. Breit , Dennis M. Feenaghty
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Stanton Braden
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
An apparatus and method for determining radiated performance of multiple antennas in a wireless system on the basis of capacity degradation comprising calculating a plurality of normalized IID channel matrices based on a plurality of complex gain patterns; calculating a plurality of colored channel matrices based on the plurality of normalized IID channel matrices; calculating a first channel capacity corresponding to the plurality of normalized IID channel matrices; calculating a second channel capacity corresponding to the plurality of colored channel matrices; and calculating a capacity degradation based on the first channel capacity and the second channel capacity.
Public/Granted literature
- US20110081869A1 APPARATUS AND METHOD FOR DETERMINING MULTI-ANTENNA RADIATED PERFORMANCE OF WIRELESS DEVICES Public/Granted day:2011-04-07
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