Invention Grant
- Patent Title: Method and system for analyzing a plurality of parts
- Patent Title (中): 用于分析多个部件的方法和系统
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Application No.: US12640721Application Date: 2009-12-17
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Publication No.: US08412558B2Publication Date: 2013-04-02
- Inventor: Syamala Srinivasan , Nelson A. Jones , Sunit K. Sachdev
- Applicant: Syamala Srinivasan , Nelson A. Jones , Sunit K. Sachdev
- Applicant Address: US IL Naperville
- Assignee: Akoya, Inc.
- Current Assignee: Akoya, Inc.
- Current Assignee Address: US IL Naperville
- Agency: Ice Miller LLP
- Main IPC: G06Q10/00
- IPC: G06Q10/00
Abstract:
The present invention includes a method and system configured to analyze a plurality of parts, each of the parts having at least one part characteristic. The method includes the steps of establishing at least one repository of the part characteristics, establishing a relationship between at least a portion of the parts and a cost characteristic; and, analyzing the portion of the parts in response to the relationship.
Public/Granted literature
- US20110153376A1 METHOD AND SYSTEM FOR ANALYZING A PLURALITY OF PARTS Public/Granted day:2011-06-23
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