Invention Grant
- Patent Title: Temperature and humidity measuring device deployed on substrate
- Patent Title (中): 温湿度测量装置部署在基板上
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Application No.: US12914841Application Date: 2010-10-28
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Publication No.: US08413505B2Publication Date: 2013-04-09
- Inventor: Ke-Chih Chien , Ming-Long Chiu , Pao-Yi Lu
- Applicant: Ke-Chih Chien , Ming-Long Chiu , Pao-Yi Lu
- Applicant Address: TW Taipei County
- Assignee: Gudeng Precision Industrial Co, Ltd
- Current Assignee: Gudeng Precision Industrial Co, Ltd
- Current Assignee Address: TW Taipei County
- Agency: Sinorica, LLC
- Agent Ming Chow
- Main IPC: G01N19/10
- IPC: G01N19/10

Abstract:
The present invention provides a temperature and humidity measuring and recording device deployed on substrate for measuring and recording temperature and humidity of the interior of any station for reticles and of any SMIF POD. The temperature and humidity measuring and recording device comprises a substrate with a first surface and a second surface opposite to the first surface on another side of the substrate, a first measurement unit embedded in and fixed to the first surface of the substrate for measuring the temperature and humidity of the surrounding environment, and a second measurement unit embedded in and fixed to the second surface of the substrate for measuring the temperature and humidity of the interior between the substrate and the pellicle film.
Public/Granted literature
- US20120103092A1 Temperature and Humidity Measuring Device Deployed on Substrate Public/Granted day:2012-05-03
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