Invention Grant
- Patent Title: Ultrasonic inspection apparatus
- Patent Title (中): 超声波检测仪
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Application No.: US12918904Application Date: 2009-02-26
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Publication No.: US08413515B2Publication Date: 2013-04-09
- Inventor: Hideo Isobe , Hirokazu Karasawa
- Applicant: Hideo Isobe , Hirokazu Karasawa
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP2008-044307 20080226
- International Application: PCT/JP2009/053600 WO 20090226
- International Announcement: WO2009/107745 WO 20090903
- Main IPC: G01N29/265
- IPC: G01N29/265

Abstract:
There is provided an ultrasonic inspection apparatus which detects various deviations with respect to an ideal scanning position and achieves, with high accuracy, an ultrasound flaw inspection by autonomously adjusting the deviations. The ultrasonic inspection apparatus according to the present invention is provided with an integrated type ultrasound transducer including an ultrasonic transducer, an integral type ultrasound transducer control unit, an actuator for distance adjustment, an actuator for tilt control, and a distance measuring sensor. The integrated type ultrasound transducer calculates a deviation between a scanning position based on a preliminarily generated scanning path information and an ideal scanning position, and performs a deviation correction processing by autonomously controlling a distance and a tilt between an opening surface of the ultrasound transducer and an inspection region of an object to be inspected in accordance with this deviation.
Public/Granted literature
- US20110000299A1 ULTRASONIC INSPECTION APPARATUS Public/Granted day:2011-01-06
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